EYP Technical Director John Tobin, LEED™, was invited to share his Building Information Modeling (BIM) expertise at the recent 2008 BIM Convergence at Virginia Tech. His session, which included three other panelists, was entitled, “Perspective of the Designers.” Tobin spoke on numerous topics, including the adoption of BIM, the use of Revit as a beta tester, and the unique ways that EYP incorporates BIM into its projects and processes.